FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60 xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026 xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e xe-4811-d699fa2d9776038b13f7b8153738a850676d0641 xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86 xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00 xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460 xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563 xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637 xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1 xe-4804-a748e8ef327c92c865410957509417b30f026304 xe-4803-0a7844908d3616b88a7887704eb6dfa0d315be1b xe-4802-113d411a9890a805edaffd3c3dd2cf436a868b68 xe-4800-e65b0adc5230d380c38a1715abade2bcbb7f876d xe-4799-e7f370d78d32ed29cc3f100fbc3d1fe1a844978f
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60

Using IGT_SRANDOM=1774719082 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026

Using IGT_SRANDOM=1774712563 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e

Using IGT_SRANDOM=1774705773 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4811-d699fa2d9776038b13f7b8153738a850676d0641

Using IGT_SRANDOM=1774694709 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86

Using IGT_SRANDOM=1774690329 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00

Using IGT_SRANDOM=1774687958 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460

Using IGT_SRANDOM=1774685732 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563

Using IGT_SRANDOM=1774683597 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637

Using IGT_SRANDOM=1774677153 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1

Using IGT_SRANDOM=1774666093 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4804-a748e8ef327c92c865410957509417b30f026304

Using IGT_SRANDOM=1774655196 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4803-0a7844908d3616b88a7887704eb6dfa0d315be1b

Using IGT_SRANDOM=1774644130 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4802-113d411a9890a805edaffd3c3dd2cf436a868b68

Using IGT_SRANDOM=1774639682 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4800-e65b0adc5230d380c38a1715abade2bcbb7f876d

Using IGT_SRANDOM=1774635164 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-upscaling
xe-4799-e7f370d78d32ed29cc3f100fbc3d1fe1a844978f

Using IGT_SRANDOM=1774615076 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-28 18:15:35