FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4372-38e0a7138ef62d49ddc449601fc5456099ef33b2 xe-4371-630dc29de423d3640e7b2ee4a7125e0433d9eb7f xe-4370-fb2e525015f1b65b83809995601ea7827ee08ab9 xe-4369-eb2f46812a9a0e6d50ef9857c737cef369b6a9c0 IGT_8697 xe-4368-e9383891a008f23b432b7b3c4ca2d7dd0f49824d xe-4367-c5c745af9e6e74e47486b077ca7d8e3ae2861420 xe-4366-02d963d26c9fc627cd1133570136597416e41994 xe-4365-f339d0352f5f7e023e8ff89bb18291df8dfdad6e IGT_8696 IGT_8695 xe-4364-629c8a9146d75c96e2704592f8764f9553b5fd39 xe-4363-96728f04288ac8ffab7f463fb31f3e5c50ecc4a1 xe-4362-8b38d6decc6810939f06135b7a84b03e436c87e6 xe-4361-070b98e5f13d7b8c95b1f348629cdef8b7aafa80
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4372-38e0a7138ef62d49ddc449601fc5456099ef33b2

Using IGT_SRANDOM=1768279538 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.112s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.113s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4371-630dc29de423d3640e7b2ee4a7125e0433d9eb7f

Using IGT_SRANDOM=1768277075 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.109s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.110s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4370-fb2e525015f1b65b83809995601ea7827ee08ab9

Using IGT_SRANDOM=1768269500 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.111s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.113s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4369-eb2f46812a9a0e6d50ef9857c737cef369b6a9c0

Using IGT_SRANDOM=1768259556 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.113s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.115s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
IGT_8697

Using IGT_SRANDOM=1768252152 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.101s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.103s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4368-e9383891a008f23b432b7b3c4ca2d7dd0f49824d

Using IGT_SRANDOM=1768249515 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.104s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.105s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4367-c5c745af9e6e74e47486b077ca7d8e3ae2861420

Using IGT_SRANDOM=1768243156 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.112s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.113s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4366-02d963d26c9fc627cd1133570136597416e41994

Using IGT_SRANDOM=1768233347 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.114s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.115s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4365-f339d0352f5f7e023e8ff89bb18291df8dfdad6e

Using IGT_SRANDOM=1768199088 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.101s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.102s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
IGT_8696

Using IGT_SRANDOM=1768196803 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.108s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.109s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
IGT_8695

Using IGT_SRANDOM=1768187828 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.104s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.106s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4364-629c8a9146d75c96e2704592f8764f9553b5fd39

Using IGT_SRANDOM=1768144996 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.103s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.104s)
 
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4362-8b38d6decc6810939f06135b7a84b03e436c87e6

Using IGT_SRANDOM=1768070082 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.109s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.110s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling@pipe-a-valid-mode
xe-4361-070b98e5f13d7b8c95b1f348629cdef8b7aafa80

Using IGT_SRANDOM=1768023032 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.105s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.105s)
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-01-13 05:14:31