FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-5073-d47455904378e2bd24294dae67bfc7e442f58c40 xe-5072-7e5a51dc7012a8abe09f9232d2c303402875761e xe-5071-a1a57264631438664f3a8ed72028ff07ce298726 xe-5070-6681fce6f64ee2d5c9a152a9d8c192856ac3acf7 xe-5069-955e6bde1057d27c39cd2181c5a6b23a7ff2e415 xe-5068-25de7fb53bca724e7864b6bd8280aa1ec59429e3 IGT_8917 IGT_8916 IGT_8915 xe-5067-b9819223b7e92173091b674c2212252b99ea6c4b IGT_8914 IGT_8913 xe-5066-2edbd77a2045d12d30c95dbb5842b831e3da0035 xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf xe-5064-28f34293d760e15171071cb79028e669a8316a8f
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5073-d47455904378e2bd24294dae67bfc7e442f58c40
Using IGT_SRANDOM=1778940978 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5072-7e5a51dc7012a8abe09f9232d2c303402875761e
Using IGT_SRANDOM=1778934234 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5071-a1a57264631438664f3a8ed72028ff07ce298726
Using IGT_SRANDOM=1778931613 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5070-6681fce6f64ee2d5c9a152a9d8c192856ac3acf7
Using IGT_SRANDOM=1778928934 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5069-955e6bde1057d27c39cd2181c5a6b23a7ff2e415
Using IGT_SRANDOM=1778921188 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5068-25de7fb53bca724e7864b6bd8280aa1ec59429e3
Using IGT_SRANDOM=1778902534 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8917
Using IGT_SRANDOM=1778899698 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8916
Using IGT_SRANDOM=1778895502 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8915
Using IGT_SRANDOM=1778893029 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5067-b9819223b7e92173091b674c2212252b99ea6c4b
Using IGT_SRANDOM=1778878944 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8914
Using IGT_SRANDOM=1778876269 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
 
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5066-2edbd77a2045d12d30c95dbb5842b831e3da0035
Using IGT_SRANDOM=1778858262 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf
Using IGT_SRANDOM=1778847589 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5064-28f34293d760e15171071cb79028e669a8316a8f
Using IGT_SRANDOM=1778842190 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5073-d47455904378e2bd24294dae67bfc7e442f58c40
Using IGT_SRANDOM=1778941228 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5072-7e5a51dc7012a8abe09f9232d2c303402875761e
Using IGT_SRANDOM=1778934890 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5071-a1a57264631438664f3a8ed72028ff07ce298726
Using IGT_SRANDOM=1778932286 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5070-6681fce6f64ee2d5c9a152a9d8c192856ac3acf7
Using IGT_SRANDOM=1778929544 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5069-955e6bde1057d27c39cd2181c5a6b23a7ff2e415
Using IGT_SRANDOM=1778921772 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5068-25de7fb53bca724e7864b6bd8280aa1ec59429e3
Using IGT_SRANDOM=1778903139 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8917
Using IGT_SRANDOM=1778900326 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8916
Using IGT_SRANDOM=1778895850 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8915
Using IGT_SRANDOM=1778893923 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5067-b9819223b7e92173091b674c2212252b99ea6c4b
Using IGT_SRANDOM=1778879615 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8914
Using IGT_SRANDOM=1778876997 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
IGT_8913
Using IGT_SRANDOM=1778869449 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5066-2edbd77a2045d12d30c95dbb5842b831e3da0035
Using IGT_SRANDOM=1778858578 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf
Using IGT_SRANDOM=1778847935 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-32bpp-ytile-downscaling
xe-5064-28f34293d760e15171071cb79028e669a8316a8f
Using IGT_SRANDOM=1778842649 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-32bpp-ytile-downscaling: SKIP (0.000s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-05-16 15:02:03