igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode CI History

IGT_8677

xe-4296-cab246648fd89efbe8d20ed4c86e7fcebd7606da

xe-4295-f101d56dc32350daa45c130ff7a6d46512f614a9

xe-4294-92cfd765fcc4d84dbc90a99e775aed679f33efce

xe-4293-0b9ab258bd57ffe1b88e942940534f4bf5139b72

xe-4292-373a53bd0fb5466451d376c4d54409d271ff26f2

xe-4290-5f136224303e8b3130c6e2297fe52b44a77702c7

xe-4289-3b5cb684dfb42b6de765f3ec55bc6ab6f2aa4af3

xe-4278-084f282815b3726d333e8c9c16b5e47ef9813ae7

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4302-5c680ac45628b1951d20a444f400c82242029031

Using IGT_SRANDOM=1766620771 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.064s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.066s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4301-30c3fd5fa504deeb29ce450018374f7e950d521c

Using IGT_SRANDOM=1766600097 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.121s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.122s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4300-118253beb8169c9de3fa40b47cdf95bee6add3d7

Using IGT_SRANDOM=1766567793 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.098s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.099s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4299-98edae719c01b9b6b662528549fe1887112f39d8

Using IGT_SRANDOM=1766562554 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.108s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.110s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4298-87b84fb15a5b9a63171d43d46e2ff2ae2eea0770

Using IGT_SRANDOM=1766557570 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.065s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.066s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4297-98fdf8a438c3a1d9de8d5804cdcda94e097d53a0

Using IGT_SRANDOM=1766539752 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.106s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.107s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
IGT_8677

Using IGT_SRANDOM=1766532491 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.111s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.112s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4296-cab246648fd89efbe8d20ed4c86e7fcebd7606da

Using IGT_SRANDOM=1766522924 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.106s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.108s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4295-f101d56dc32350daa45c130ff7a6d46512f614a9

Using IGT_SRANDOM=1766450490 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.091s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.092s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4292-373a53bd0fb5466451d376c4d54409d271ff26f2

Using IGT_SRANDOM=1766419158 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.097s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.098s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4290-5f136224303e8b3130c6e2297fe52b44a77702c7

Using IGT_SRANDOM=1766402203 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.106s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.108s)

igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling@pipe-a-valid-mode
xe-4278-084f282815b3726d333e8c9c16b5e47ef9813ae7

Using IGT_SRANDOM=1766249499 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-valid-mode: SKIP (0.097s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.099s)