FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4695-e2ad8f051843c953c01f8609c8b392abc2bd5c82 xe-4694-1735c19271f165607ec241f06d61d3f6a8abd585 xe-4693-ab86ea7989502faeabd9bceb2264d8dbfed6e8ce xe-4692-4115adfa36043651de04d911c3a98d821a8fa040 IGT_8792 xe-4691-bf3ba6a508ffb59323357535a459eb64f02d94f7 xe-4688-7282a0941df77adea4aeae319d4ff11358c98584 IGT_8791 xe-4687-6c959d6b1b7822d8eefa05569ad62094c7bd617c IGT_8790 IGT_8789 xe-4686-77e176657e782bb81270c230d1cfec91f7707162 IGT_8788 xe-4685-71b3cc58bba99c872dec0669999a487f66873f5c xe-4684-6fb391baa6059adc4a8e75765a1ebf64868fc1a9
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8791
Using IGT_SRANDOM=1773172987 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4687-6c959d6b1b7822d8eefa05569ad62094c7bd617c
Using IGT_SRANDOM=1773170546 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8790
Using IGT_SRANDOM=1773157602 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8789
Using IGT_SRANDOM=1773147548 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4686-77e176657e782bb81270c230d1cfec91f7707162
Using IGT_SRANDOM=1773144810 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8788
Using IGT_SRANDOM=1773129627 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4685-71b3cc58bba99c872dec0669999a487f66873f5c
Using IGT_SRANDOM=1773126156 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4684-6fb391baa6059adc4a8e75765a1ebf64868fc1a9
Using IGT_SRANDOM=1773116541 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8791
Using IGT_SRANDOM=1773172580 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4687-6c959d6b1b7822d8eefa05569ad62094c7bd617c
Using IGT_SRANDOM=1773170231 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8790
Using IGT_SRANDOM=1773156927 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8789
Using IGT_SRANDOM=1773146902 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4686-77e176657e782bb81270c230d1cfec91f7707162
Using IGT_SRANDOM=1773144562 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
IGT_8788
Using IGT_SRANDOM=1773129069 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4685-71b3cc58bba99c872dec0669999a487f66873f5c
Using IGT_SRANDOM=1773125692 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-upscaling
xe-4684-6fb391baa6059adc4a8e75765a1ebf64868fc1a9
Using IGT_SRANDOM=1773116873 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-16bpp-ytile-upscaling: SKIP (0.000s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-11 03:45:49