FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-5118-60d51bdeabf700864c26264c51b146a86b0a9124 xe-5117-583669c11641772169ab164210e3e1d271a58e93 xe-5116-127c8434a6a018110189cdb654719a9844702ff7 IGT_8936 xe-5115-8345929e243a7114bc17c48d0ff01923d2daae76 xe-5114-7e25390024f8a4a9fdd6ec50f000ee25c006c02f IGT_8935 IGT_8934 IGT_8933 IGT_8932 xe-5113-f103db97c610a41177720b08aa4a2a05f9b42d49 IGT_8931 xe-5112-e9de0b849a470648be042d4e10dfdf37dea0c807 xe-5111-8685faab47e7160aabc4a2761545f8604b6e3679 IGT_8930
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5118-60d51bdeabf700864c26264c51b146a86b0a9124
Using IGT_SRANDOM=1779496258 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5117-583669c11641772169ab164210e3e1d271a58e93
Using IGT_SRANDOM=1779488630 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5116-127c8434a6a018110189cdb654719a9844702ff7
Using IGT_SRANDOM=1779464682 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8936
Using IGT_SRANDOM=1779462290 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5115-8345929e243a7114bc17c48d0ff01923d2daae76
Using IGT_SRANDOM=1779458623 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5114-7e25390024f8a4a9fdd6ec50f000ee25c006c02f
Using IGT_SRANDOM=1779448036 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8935
Using IGT_SRANDOM=1779445571 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8934
Using IGT_SRANDOM=1779444270 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8933
Using IGT_SRANDOM=1779422295 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8932
Using IGT_SRANDOM=1779409614 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
 
 
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5112-e9de0b849a470648be042d4e10dfdf37dea0c807
Using IGT_SRANDOM=1779389745 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5111-8685faab47e7160aabc4a2761545f8604b6e3679
Using IGT_SRANDOM=1779387146 for randomisation
Test requirement not met in function drm_open_driver, file ../lib/drmtest.c:754:
Test requirement: !(fd<0)
No known gpu found for chipset flags 0x129 (other)
Last errno: 125, Operation canceled
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8930
Using IGT_SRANDOM=1779382067 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5118-60d51bdeabf700864c26264c51b146a86b0a9124
Using IGT_SRANDOM=1779497125 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5117-583669c11641772169ab164210e3e1d271a58e93
Using IGT_SRANDOM=1779489253 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5116-127c8434a6a018110189cdb654719a9844702ff7
Using IGT_SRANDOM=1779465336 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8936
Using IGT_SRANDOM=1779462747 for randomisation
Opened device: /dev/dri/card1
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5115-8345929e243a7114bc17c48d0ff01923d2daae76
Using IGT_SRANDOM=1779459114 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5114-7e25390024f8a4a9fdd6ec50f000ee25c006c02f
Using IGT_SRANDOM=1779448593 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8935
Using IGT_SRANDOM=1779446051 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8934
Using IGT_SRANDOM=1779444857 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8933
Using IGT_SRANDOM=1779422879 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8932
Using IGT_SRANDOM=1779410004 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5113-f103db97c610a41177720b08aa4a2a05f9b42d49
Using IGT_SRANDOM=1779401101 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
 
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5112-e9de0b849a470648be042d4e10dfdf37dea0c807
Using IGT_SRANDOM=1779389878 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
xe-5111-8685faab47e7160aabc4a2761545f8604b6e3679
Using IGT_SRANDOM=1779387269 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling
IGT_8930
Using IGT_SRANDOM=1779382028 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.000s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-05-23 01:02:11