igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling CI History

Using IGT_SRANDOM=1768259184 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.255s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.256s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
IGT_8697

Using IGT_SRANDOM=1768251742 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.223s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.225s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4368-e9383891a008f23b432b7b3c4ca2d7dd0f49824d

Using IGT_SRANDOM=1768249182 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.236s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.237s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4367-c5c745af9e6e74e47486b077ca7d8e3ae2861420

Using IGT_SRANDOM=1768243273 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.168s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.169s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4366-02d963d26c9fc627cd1133570136597416e41994

Using IGT_SRANDOM=1768233754 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.209s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.210s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
IGT_8696

Using IGT_SRANDOM=1768196706 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.250s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.251s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4365-f339d0352f5f7e023e8ff89bb18291df8dfdad6e

Using IGT_SRANDOM=1768199197 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.239s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.240s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
IGT_8695

Using IGT_SRANDOM=1768188838 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.269s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.270s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4364-629c8a9146d75c96e2704592f8764f9553b5fd39

Using IGT_SRANDOM=1768144305 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.189s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.190s)

igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-32bpp-xtile-downscaling
xe-4363-96728f04288ac8ffab7f463fb31f3e5c50ecc4a1

Using IGT_SRANDOM=1768091081 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-32bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.228s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-32bpp-xtile-downscaling: SKIP (1.230s)