FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
IGT_8799 xe-4707-3ccc0e3404591e404d0dee79406cd013f377356a xe-4706-72190ebdd4c0e9a2b454b04ba382beeb6020e047 xe-4705-a0e231ebb0df84f6febf147ee5fcaafd40c2dafe IGT_8798 xe-4704-169ea69ad8f2fb0a126608399386e4580bb2d0b0 xe-4703-389757a158d828affd3a4c242b98ffac9646daf3 IGT_8797 IGT_8796 xe-4702-4f823cb4f9faf6611f35c6a8a71ab696e3a734d6 IGT_8795 xe-4701-f8d4fc8745a5d5c57dd1e020fdb5c68f91fe33a7 IGT_8794 xe-4700-4a30f5fa0fe382b3915a8208a483d0044c40b9eb IGT_8793
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
 
 
 
 
 
 
 
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
xe-4702-4f823cb4f9faf6611f35c6a8a71ab696e3a734d6

Using IGT_SRANDOM=1773322162 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.213s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.215s)
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
IGT_8795

Using IGT_SRANDOM=1773320104 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.166s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.168s)
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
xe-4701-f8d4fc8745a5d5c57dd1e020fdb5c68f91fe33a7

Using IGT_SRANDOM=1773319899 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.194s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.196s)
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
IGT_8794

Using IGT_SRANDOM=1773303922 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.170s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.173s)
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
xe-4700-4a30f5fa0fe382b3915a8208a483d0044c40b9eb

Using IGT_SRANDOM=1773294042 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.187s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.189s)
igt@kms_flip_scaled_crc@flip-64bpp-xtile-to-16bpp-xtile-downscaling
IGT_8793

Using IGT_SRANDOM=1773285292 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-xtile-to-16bpp-xtile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.163s)
No dynamic tests executed.
Subtest flip-64bpp-xtile-to-16bpp-xtile-downscaling: SKIP (1.165s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-12 16:48:46