FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4840-5ab3838428d9d2baa881cb9b23a30cc77e5c893c xe-4839-2ca39f35278e7f6e1750c710e75c32172fb1aa11 IGT_8842 xe-4838-f1d4727d10d243dfe9253bc650258827a8a7dbb8 xe-4837-35370a958ae250844fbacb7a26230032a4fa661c xe-4836-1ff774f6f4c8eda84d6efdd581c30d8ad88f07a1 IGT_8841 xe-4835-3bc4b20741a977a593763678ab6d5b23c3e10d6c xe-4834-35dad892ec87d448384f492ba061d0da7e3710a5 IGT_8840 xe-4833-5d36e6d54e963f0c1137aaf2249d2baa781f08c2 xe-4832-693faeb5d81d15bbf46552dc3a225072e645d6dc xe-4831-ec2d5f6e76f906370ac56a3d6056891e321b299f xe-4830-e024431a4dc3a2cc320e6093dd95d0c5d0e2935f xe-4829-278bbcb469a2ab0d521e910e4ecefc8372a05c1e
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
 
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4837-35370a958ae250844fbacb7a26230032a4fa661c

Using IGT_SRANDOM=1775121482 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.202s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.204s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4836-1ff774f6f4c8eda84d6efdd581c30d8ad88f07a1

Using IGT_SRANDOM=1775114735 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.212s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.214s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
IGT_8841

Using IGT_SRANDOM=1775103760 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.161s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.163s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4835-3bc4b20741a977a593763678ab6d5b23c3e10d6c

Using IGT_SRANDOM=1775088613 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.202s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.204s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4834-35dad892ec87d448384f492ba061d0da7e3710a5

Using IGT_SRANDOM=1775082156 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.215s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.216s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
IGT_8840

Using IGT_SRANDOM=1775064238 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.188s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.189s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4833-5d36e6d54e963f0c1137aaf2249d2baa781f08c2

Using IGT_SRANDOM=1775059882 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.174s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.176s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4832-693faeb5d81d15bbf46552dc3a225072e645d6dc

Using IGT_SRANDOM=1775053387 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.247s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.249s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4831-ec2d5f6e76f906370ac56a3d6056891e321b299f

Using IGT_SRANDOM=1775046567 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.258s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.260s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4830-e024431a4dc3a2cc320e6093dd95d0c5d0e2935f

Using IGT_SRANDOM=1775035540 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.256s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.258s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling
xe-4829-278bbcb469a2ab0d521e910e4ecefc8372a05c1e

Using IGT_SRANDOM=1775022403 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.185s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.187s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-04-02 09:41:03