FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4818-2662531d3ccb4a569271b75e4a9ccb58990424d8 IGT_8835 xe-4817-24a8a6cff08b6e20acb0f4c2d32acf26aa2087db xe-4816-06e0b4c93016fd9579daea841abc5f02fc685197 xe-4815-f712205aed1e52edaa3bfa1d1949511478a93524 xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60 xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026 xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e xe-4811-d699fa2d9776038b13f7b8153738a850676d0641 xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86 xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00 xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460 xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563 xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637 xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4818-2662531d3ccb4a569271b75e4a9ccb58990424d8

Using IGT_SRANDOM=1774859465 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.228s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.230s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
IGT_8835

Using IGT_SRANDOM=1774850546 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.192s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.193s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4817-24a8a6cff08b6e20acb0f4c2d32acf26aa2087db

Using IGT_SRANDOM=1774844110 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.193s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.195s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4816-06e0b4c93016fd9579daea841abc5f02fc685197

Using IGT_SRANDOM=1774831904 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.210s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.211s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4815-f712205aed1e52edaa3bfa1d1949511478a93524

Using IGT_SRANDOM=1774828585 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.185s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.187s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60

Using IGT_SRANDOM=1774720660 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.177s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.179s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026

Using IGT_SRANDOM=1774714171 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.196s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.198s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e

Using IGT_SRANDOM=1774707469 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.197s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.199s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4811-d699fa2d9776038b13f7b8153738a850676d0641

Using IGT_SRANDOM=1774696292 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.195s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.196s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86

Using IGT_SRANDOM=1774691889 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.182s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.184s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00

Using IGT_SRANDOM=1774689610 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.212s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.214s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460

Using IGT_SRANDOM=1774687389 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.203s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.205s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563

Using IGT_SRANDOM=1774685155 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.205s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.207s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637

Using IGT_SRANDOM=1774678610 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.199s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.202s)
igt@kms_flip_scaled_crc@flip-64bpp-4tile-to-32bpp-4tile-downscaling
xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1

Using IGT_SRANDOM=1774667696 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-4tile-to-32bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.191s)
No dynamic tests executed.
Subtest flip-64bpp-4tile-to-32bpp-4tile-downscaling: SKIP (1.193s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-30 08:49:08