FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
IGT_8917 xe-5068-25de7fb53bca724e7864b6bd8280aa1ec59429e3 IGT_8916 IGT_8915 IGT_8914 xe-5067-b9819223b7e92173091b674c2212252b99ea6c4b IGT_8913 xe-5066-2edbd77a2045d12d30c95dbb5842b831e3da0035 xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf xe-5064-28f34293d760e15171071cb79028e669a8316a8f IGT_8912 xe-5063-121c16f9d8c56ea07263df84ab971cc10870fe88 IGT_8911 xe-5062-dee34cfbffbfe2196a9332f966b006cd2e54e976 IGT_8910
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf
Using IGT_SRANDOM=1778846396 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5064-28f34293d760e15171071cb79028e669a8316a8f
Using IGT_SRANDOM=1778841001 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
IGT_8912
Using IGT_SRANDOM=1778824945 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5063-121c16f9d8c56ea07263df84ab971cc10870fe88
Using IGT_SRANDOM=1778827706 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5062-dee34cfbffbfe2196a9332f966b006cd2e54e976
Using IGT_SRANDOM=1778807521 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
IGT_8910
Using IGT_SRANDOM=1778802365 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5065-66af2225d31aa8315b0b9f3c735dba4a53e8d3bf
Using IGT_SRANDOM=1778846981 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5064-28f34293d760e15171071cb79028e669a8316a8f
Using IGT_SRANDOM=1778841785 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
IGT_8912
Using IGT_SRANDOM=1778825639 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5063-121c16f9d8c56ea07263df84ab971cc10870fe88
Using IGT_SRANDOM=1778828224 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
IGT_8911
Using IGT_SRANDOM=1778810271 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
xe-5062-dee34cfbffbfe2196a9332f966b006cd2e54e976
Using IGT_SRANDOM=1778808003 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling
IGT_8910
Using IGT_SRANDOM=1778802839 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.000s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-05-15 14:08:48