FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4818-2662531d3ccb4a569271b75e4a9ccb58990424d8 IGT_8835 xe-4817-24a8a6cff08b6e20acb0f4c2d32acf26aa2087db xe-4816-06e0b4c93016fd9579daea841abc5f02fc685197 xe-4815-f712205aed1e52edaa3bfa1d1949511478a93524 xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60 xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026 xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e xe-4811-d699fa2d9776038b13f7b8153738a850676d0641 xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86 xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00 xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460 xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563 xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637 xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4818-2662531d3ccb4a569271b75e4a9ccb58990424d8

Using IGT_SRANDOM=1774858397 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.257s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.258s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
IGT_8835

Using IGT_SRANDOM=1774849526 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.264s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.266s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4817-24a8a6cff08b6e20acb0f4c2d32acf26aa2087db

Using IGT_SRANDOM=1774843224 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.194s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.195s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4816-06e0b4c93016fd9579daea841abc5f02fc685197

Using IGT_SRANDOM=1774830981 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.177s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.179s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4815-f712205aed1e52edaa3bfa1d1949511478a93524

Using IGT_SRANDOM=1774827669 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.170s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.172s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4814-457f49574f26444c7089f03d86b8b5993d05ff60

Using IGT_SRANDOM=1774719770 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.184s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.186s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4813-b8c1f8bc16b8aeff4f912cf2d7d0bf385d5ae026

Using IGT_SRANDOM=1774713188 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.261s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.262s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4812-7556ae31e73dcad3716592bbdfd19068164c6a0e

Using IGT_SRANDOM=1774706606 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.189s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.191s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4811-d699fa2d9776038b13f7b8153738a850676d0641

Using IGT_SRANDOM=1774695382 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.253s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.255s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4810-b41c4d2aa654dcf4dbf6c71be843b8aba3439b86

Using IGT_SRANDOM=1774691024 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.158s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.159s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4809-5df2c727c885d0f1132911a88aadf584b5306f00

Using IGT_SRANDOM=1774688778 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.231s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.233s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4808-5e969b40dc7d9c8586e1e0725bcaa78b040b3460

Using IGT_SRANDOM=1774686529 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.264s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.266s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4807-85c6901f0428b3e7cc68ab54f675695fa0fa0563

Using IGT_SRANDOM=1774684299 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.169s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.171s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4806-b0c967b64ac6322238cc1cbabd75a3be31fbb637

Using IGT_SRANDOM=1774677724 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.260s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.261s)
igt@kms_flip_scaled_crc@flip-32bpp-4tile-to-64bpp-4tile-downscaling
xe-4805-b75bacf9b36568f2ebf5319b955ba0c9cab5d6d1

Using IGT_SRANDOM=1774666846 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-4tile-to-64bpp-4tile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.256s)
No dynamic tests executed.
Subtest flip-32bpp-4tile-to-64bpp-4tile-downscaling: SKIP (1.257s)
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-30 08:49:00