FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
IGT_8815 xe-4752-7535044a2418d22b59be0eb64af0353971f16bd8 xe-4751-b36e6a46f431d16e714f042db718495222a4c48a xe-4750-e4242b1733f42c5cf067ef4cda1a7e424d9b1dc0 IGT_8814 IGT_8813 IGT_8812 xe-4749-4ae9f18564e78a5447be68aa1e9232a4f2c37b5a xe-4748-242f4d8af4c4708eabb93e79949d45caec8d4354 IGT_8811 xe-4747-f4482de2c06e19b0c337b774e485755378990614 xe-4746-73694175c9632682b410199c5987a3420bd5444c IGT_8810 xe-4745-61409ba11a36fa5aff4ce0f0086a6026a43c5bce IGT_8809
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8815

Using IGT_SRANDOM=1774095008 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4752-7535044a2418d22b59be0eb64af0353971f16bd8

Using IGT_SRANDOM=1774086400 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4751-b36e6a46f431d16e714f042db718495222a4c48a

Using IGT_SRANDOM=1774081999 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4750-e4242b1733f42c5cf067ef4cda1a7e424d9b1dc0

Using IGT_SRANDOM=1774075400 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8814

Using IGT_SRANDOM=1774070970 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8813

Using IGT_SRANDOM=1774060789 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8812

Using IGT_SRANDOM=1774051604 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4749-4ae9f18564e78a5447be68aa1e9232a4f2c37b5a

Using IGT_SRANDOM=1774050010 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4748-242f4d8af4c4708eabb93e79949d45caec8d4354

Using IGT_SRANDOM=1774032285 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8811

Using IGT_SRANDOM=1774017443 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4747-f4482de2c06e19b0c337b774e485755378990614

Using IGT_SRANDOM=1774014514 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4746-73694175c9632682b410199c5987a3420bd5444c

Using IGT_SRANDOM=1774007779 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8810

Using IGT_SRANDOM=1773975664 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4745-61409ba11a36fa5aff4ce0f0086a6026a43c5bce

Using IGT_SRANDOM=1773973506 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8809

Using IGT_SRANDOM=1773967595 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-21 12:56:29