igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs CI History

Using IGT_SRANDOM=1773360865 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...

igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8797

Using IGT_SRANDOM=1773358672 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...

igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8796

Using IGT_SRANDOM=1773356533 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...

igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4702-4f823cb4f9faf6611f35c6a8a71ab696e3a734d6

Using IGT_SRANDOM=1773323149 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...

igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
IGT_8795

Using IGT_SRANDOM=1773320925 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...

igt@kms_ccs@crc-primary-suspend-4-tiled-bmg-ccs
xe-4701-f8d4fc8745a5d5c57dd1e020fdb5c68f91fe33a7

Using IGT_SRANDOM=1773317877 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-suspend-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe B
...