FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4748-242f4d8af4c4708eabb93e79949d45caec8d4354 IGT_8811 xe-4747-f4482de2c06e19b0c337b774e485755378990614 xe-4746-73694175c9632682b410199c5987a3420bd5444c IGT_8810 xe-4745-61409ba11a36fa5aff4ce0f0086a6026a43c5bce IGT_8809 xe-4744-185629feb8aee7cf88f72d1e67531574f1bea7f5 xe-4743-58de207a4431fd09fbee9009061adea3b8c5e039 IGT_8808 xe-4742-146a21986f74225d0343edeb925095825fa5474f xe-4741-40118218067c8bd6dc0e2f62d4fdb791848b3888 xe-4740-c479cdf62a3f9a6101dd020abbc471f35142b3d1 xe-4739-14efcb821ecb1a7935a3148109e7903839243d53 xe-4738-90a49598c224945b556bee26d693fade1b8bdb3a
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4748-242f4d8af4c4708eabb93e79949d45caec8d4354
Using IGT_SRANDOM=1774032701 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
IGT_8811
Using IGT_SRANDOM=1774017735 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4747-f4482de2c06e19b0c337b774e485755378990614
Using IGT_SRANDOM=1774014901 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4746-73694175c9632682b410199c5987a3420bd5444c
Using IGT_SRANDOM=1774008213 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
IGT_8810
Using IGT_SRANDOM=1773976137 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4745-61409ba11a36fa5aff4ce0f0086a6026a43c5bce
Using IGT_SRANDOM=1773974013 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
IGT_8809
Using IGT_SRANDOM=1773968845 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4744-185629feb8aee7cf88f72d1e67531574f1bea7f5
Using IGT_SRANDOM=1773964486 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4743-58de207a4431fd09fbee9009061adea3b8c5e039
Using IGT_SRANDOM=1773960034 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
IGT_8808
Using IGT_SRANDOM=1773950439 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4742-146a21986f74225d0343edeb925095825fa5474f
Using IGT_SRANDOM=1773945701 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4741-40118218067c8bd6dc0e2f62d4fdb791848b3888
Using IGT_SRANDOM=1773939042 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4740-c479cdf62a3f9a6101dd020abbc471f35142b3d1
Using IGT_SRANDOM=1773917337 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4739-14efcb821ecb1a7935a3148109e7903839243d53
Using IGT_SRANDOM=1773908408 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
  igt@kms_ccs@crc-primary-basic-4-tiled-bmg-ccs
xe-4738-90a49598c224945b556bee26d693fade1b8bdb3a
Using IGT_SRANDOM=1773895688 for randomisation
Opened device: /dev/dri/card0
Starting subtest: crc-primary-basic-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Last errno: 9, Bad file descriptor
Dynamic subtest pipe-A-eDP-1: SKIP (0.001s)
...
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-20 19:31:15