FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4963-9ee0cde10752666aff536e55d224c02950c309b7 xe-4962-89363c11fcc2fcd068a09c06ce1a3aca43bb6bb1 xe-4961-5664aa7084dc7c29092fa73417006dfde382dd4f xe-4960-6472756e8384e3945f12b6726dd9dc1ac12f3bb4 IGT_8881 IGT_8880 xe-4959-3ac514cf64f272cc4d5143f4cc28fb18a8aba76d xe-4958-24d77c4ca7f78614b0978654f1d96763aae651bf xe-4957-98849fffd754b9c71f5d38bb370b840c33441f6a xe-4956-0ed5f88da70b2b2cc67bacb80d205cdd00a6a574 xe-4955-06667d00cd5927b60e867fe54ae5dd96a46e945a xe-4954-c50aab3f28b1580a38a58ca7a3fc3ff9ceb5d5ed xe-4953-f3b0eacc6be937779388c8412909b66717926980 xe-4952-07151705e788c02b94b1c9ab7865af250a010b17 xe-4951-bc5111f7a4ab2ac93db67c73e8766700798cfc14
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4963-9ee0cde10752666aff536e55d224c02950c309b7
Using IGT_SRANDOM=1777641142 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4962-89363c11fcc2fcd068a09c06ce1a3aca43bb6bb1
Using IGT_SRANDOM=1777633122 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4961-5664aa7084dc7c29092fa73417006dfde382dd4f
Using IGT_SRANDOM=1777628141 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4960-6472756e8384e3945f12b6726dd9dc1ac12f3bb4
Using IGT_SRANDOM=1777612526 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8881
Using IGT_SRANDOM=1777601849 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8880
Using IGT_SRANDOM=1777594444 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
 
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4958-24d77c4ca7f78614b0978654f1d96763aae651bf
Using IGT_SRANDOM=1777577974 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4957-98849fffd754b9c71f5d38bb370b840c33441f6a
Using IGT_SRANDOM=1777570038 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4956-0ed5f88da70b2b2cc67bacb80d205cdd00a6a574
Using IGT_SRANDOM=1777555161 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4955-06667d00cd5927b60e867fe54ae5dd96a46e945a
Using IGT_SRANDOM=1777552183 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4954-c50aab3f28b1580a38a58ca7a3fc3ff9ceb5d5ed
Using IGT_SRANDOM=1777544347 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4953-f3b0eacc6be937779388c8412909b66717926980
Using IGT_SRANDOM=1777535091 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4952-07151705e788c02b94b1c9ab7865af250a010b17
Using IGT_SRANDOM=1777530564 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4951-bc5111f7a4ab2ac93db67c73e8766700798cfc14
Using IGT_SRANDOM=1777522216 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-05-01 13:34:57