FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
IGT_8803 xe-4714-16a11d47689b9199a72e080ddd2267f006b545df IGT_8802 xe-4713-45618ec6cfed86e72cf6c2325c8f947bfbe7c132 IGT_8801 xe-4712-4082c266f2930288f1e9faadd4a389f15306a209 IGT_8800 xe-4711-721db23a9c232926f1e4f896d9226b9710cf658f xe-4710-29044d219ec91738869fef9d445adce5e31df374 xe-4709-3fb8dfc6a69ee530c365c36f13bb79ef7f35af1d xe-4708-111c6ccfcc3a51798d3a9b2673240699eff2e3b6 IGT_8799 xe-4707-3ccc0e3404591e404d0dee79406cd013f377356a xe-4706-72190ebdd4c0e9a2b454b04ba382beeb6020e047 xe-4705-a0e231ebb0df84f6febf147ee5fcaafd40c2dafe
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-wcl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8803

Using IGT_SRANDOM=1773522242 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4714-16a11d47689b9199a72e080ddd2267f006b545df

Using IGT_SRANDOM=1773517878 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8802

Using IGT_SRANDOM=1773506104 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4713-45618ec6cfed86e72cf6c2325c8f947bfbe7c132

Using IGT_SRANDOM=1773502917 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8801

Using IGT_SRANDOM=1773485217 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4712-4082c266f2930288f1e9faadd4a389f15306a209

Using IGT_SRANDOM=1773483712 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8800

Using IGT_SRANDOM=1773474019 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4711-721db23a9c232926f1e4f896d9226b9710cf658f

Using IGT_SRANDOM=1773471638 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4710-29044d219ec91738869fef9d445adce5e31df374

Using IGT_SRANDOM=1773456377 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4708-111c6ccfcc3a51798d3a9b2673240699eff2e3b6

Using IGT_SRANDOM=1773442512 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8799

Using IGT_SRANDOM=1773418473 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4707-3ccc0e3404591e404d0dee79406cd013f377356a

Using IGT_SRANDOM=1773413042 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4706-72190ebdd4c0e9a2b454b04ba382beeb6020e047

Using IGT_SRANDOM=1773396333 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4705-a0e231ebb0df84f6febf147ee5fcaafd40c2dafe

Using IGT_SRANDOM=1773387541 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-03-14 21:38:41