FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
xe-4337-cf42653e3e0def607bd49a8ed918bee102311450 IGT_8688 IGT_8687 xe-4336-3d6700a02638d446a4e8ad92a8212c3efef84ae0 IGT_8686 xe-4335-265d13795b45a5e68304e2cab23ea35975c871e8 xe-4334-22dc2883939d84e3e140efbeb71827aaff689f14 xe-4333-b3845fe8af5ec5c1d4b26e40ac6b4c7370e5fa35 IGT_8685 xe-4332-9081abc2c80b75a0c38ba2880f867904acd13a04 IGT_8684 xe-4331-908651b5352ab4610d22645ef30427d2d36a954c xe-4330-da7f7e8cfc9c598a4610563187e92b9ce1076432 IGT_8683 xe-4329-f5136cded03e959ebb00a1160e5f00973c38007e
bat-ptl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-ptl-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-bmg-3
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-bmg
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-1
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-lnl-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
shard-lnl
 
 
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8687
Using IGT_SRANDOM=1767730732 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4336-3d6700a02638d446a4e8ad92a8212c3efef84ae0
Using IGT_SRANDOM=1767727152 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8686
Using IGT_SRANDOM=1767701530 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4335-265d13795b45a5e68304e2cab23ea35975c871e8
Using IGT_SRANDOM=1767705402 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4334-22dc2883939d84e3e140efbeb71827aaff689f14
Using IGT_SRANDOM=1767698793 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4333-b3845fe8af5ec5c1d4b26e40ac6b4c7370e5fa35
Using IGT_SRANDOM=1767684315 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8685
Using IGT_SRANDOM=1767679606 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4332-9081abc2c80b75a0c38ba2880f867904acd13a04
Using IGT_SRANDOM=1767676825 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8684
Using IGT_SRANDOM=1767644875 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4331-908651b5352ab4610d22645ef30427d2d36a954c
Using IGT_SRANDOM=1767671733 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4330-da7f7e8cfc9c598a4610563187e92b9ce1076432
Using IGT_SRANDOM=1767640804 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
IGT_8683
Using IGT_SRANDOM=1767625872 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
  igt@kms_ccs@bad-rotation-90-4-tiled-bmg-ccs
xe-4329-f5136cded03e959ebb00a1160e5f00973c38007e
Using IGT_SRANDOM=1767616775 for randomisation
Opened device: /dev/dri/card0
Starting subtest: bad-rotation-90-4-tiled-bmg-ccs
Starting dynamic subtest: pipe-A-eDP-1
Testing format XYUV(0x56555958) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR24(0x34325258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XR30(0x30335258) / modifier 4-rc-ccs(0x100000000000011)
Testing format XB4H(0x48344258) / modifier 4-rc-ccs(0x100000000000011)
Testing format YUYV(0x56595559) / modifier 4-rc-ccs(0x100000000000011)
Testing format NV12(0x3231564e) / modifier 4-rc-ccs(0x100000000000011)
Testing format P012(0x32313050) / modifier 4-rc-ccs(0x100000000000011)
Testing format P016(0x36313050) / modifier 4-rc-ccs(0x100000000000011)
Test requirement not met in function test_output, file ../tests/intel/kms_ccs....
Test requirement: valid_tests > 0
no valid tests for 4-tiled-bmg-ccs on pipe A
Dynamic subtest pipe-A-eDP-1: SKIP (0.000s)
Starting dynamic subtest: pipe-B-eDP-1
...
bat-atsm-2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-dg2-oem2
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-7
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
bat-adlp-vm
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
Created at 2026-01-07 00:02:55