Using IGT_SRANDOM=1774240299 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774103114 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774096869 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774093607 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774080576 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774077467 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774064479 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774047906 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774044588 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774041218 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774037843 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774029222 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774016440 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774013278 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773999931 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773987448 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773978457 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773968903 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773950111 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773946981 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773940429 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773909201 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773905707 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773893251 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773889992 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773880157 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773857517 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773773962 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774240224 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774103159 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774096914 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774093656 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774080597 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774077499 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774064517 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774047868 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774044538 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774041189 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774037805 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774029692 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774017523 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774000737 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773987818 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773978473 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773968983 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773950360 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773947251 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773940723 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773909180 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773905688 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773893266 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773889778 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773880077 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773857706 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774240265 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.597s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.601s)

Using IGT_SRANDOM=1774014060 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.636s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.642s)

Using IGT_SRANDOM=1774000295 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.693s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.701s)

Using IGT_SRANDOM=1773988567 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.594s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.601s)

Using IGT_SRANDOM=1773978411 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.577s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.583s)

Using IGT_SRANDOM=1773968853 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.614s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.622s)

Using IGT_SRANDOM=1773950209 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.604s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.611s)

Using IGT_SRANDOM=1773947542 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.607s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.616s)

Using IGT_SRANDOM=1773940028 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.609s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.616s)

Using IGT_SRANDOM=1773905662 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.592s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.596s)

Using IGT_SRANDOM=1773890205 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.672s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.677s)

Using IGT_SRANDOM=1773858045 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-32bpp-ytile-upscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.631s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.638s)

Using IGT_SRANDOM=1774240202 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774103200 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774096989 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774093572 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774080576 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774077441 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774064443 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774048064 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774044722 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774041462 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774038168 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774030219 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774017248 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774014367 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1774000977 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773988342 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773979110 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773969551 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773950515 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773947725 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773941048 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773909869 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773906626 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773893694 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773890531 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773880516 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773858447 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)

Using IGT_SRANDOM=1773775228 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-64bpp-ytile-to-32bpp-ytile-upscaling: SKIP (0.000s)