FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17821 CI_DRM_17820 IGT_8701 CI_DRM_17819 IGT_8700 CI_DRM_17818 CI_DRM_17817 CI_DRM_17816 CI_DRM_17815 CI_DRM_17814 CI_DRM_17813 CI_DRM_17812 CI_DRM_17811 IGT_8699 IGT_8698 CI_DRM_17810 CI_DRM_17809 IGT_8697 CI_DRM_17808 CI_DRM_17807 CI_DRM_17806 CI_DRM_17805 CI_DRM_17804 CI_DRM_17803 IGT_8696 CI_DRM_17802 IGT_8695 CI_DRM_17801 CI_DRM_17800 CI_DRM_17799 CI_DRM_17798 IGT_8694 IGT_8693
shard-mtlp
 
 
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8701

Using IGT_SRANDOM=1768408474 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.296s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.299s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17819

Using IGT_SRANDOM=1768405344 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8700

Using IGT_SRANDOM=1768395443 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17818

Using IGT_SRANDOM=1768390669 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.292s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17817

Using IGT_SRANDOM=1768366265 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.293s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.294s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17816

Using IGT_SRANDOM=1768362071 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17815

Using IGT_SRANDOM=1768357907 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.294s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17814

Using IGT_SRANDOM=1768322421 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17813

Using IGT_SRANDOM=1768308680 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.293s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.294s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17812

Using IGT_SRANDOM=1768305373 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17811

Using IGT_SRANDOM=1768290381 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.283s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.285s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8699

Using IGT_SRANDOM=1768276807 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.299s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.300s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8698

Using IGT_SRANDOM=1768264379 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17810

Using IGT_SRANDOM=1768259848 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.291s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17809

Using IGT_SRANDOM=1768256528 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8697

Using IGT_SRANDOM=1768249901 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.291s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17808

Using IGT_SRANDOM=1768249154 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.300s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.304s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17807

Using IGT_SRANDOM=1768245736 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.295s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.296s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17806

Using IGT_SRANDOM=1768242433 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.292s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17805

Using IGT_SRANDOM=1768235857 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.292s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17804

Using IGT_SRANDOM=1768232521 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17803

Using IGT_SRANDOM=1768226199 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.294s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.296s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8696

Using IGT_SRANDOM=1768203512 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17802

Using IGT_SRANDOM=1768197163 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8695

Using IGT_SRANDOM=1768189531 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.290s)
 
 
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17799

Using IGT_SRANDOM=1768068605 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.285s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17798

Using IGT_SRANDOM=1768005447 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.293s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.295s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8694

Using IGT_SRANDOM=1767995472 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-64bpp-ytile-to-16bpp-ytile-downscaling@pipe-a-default-mode
IGT_8693

Using IGT_SRANDOM=1767949683 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-ytile-to-16bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-64bpp-ytile-to-16bpp-ytile-downscaling: SKIP (0.292s)
Created at 2026-01-14 18:08:26