FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17639 CI_DRM_17637 CI_DRM_17636 CI_DRM_17635 CI_DRM_17634 IGT_8655 CI_DRM_17633 IGT_8654 IGT_8653 CI_DRM_17632 CI_DRM_17631 CI_DRM_17630 IGT_8652 IGT_8651 IGT_8650 CI_DRM_17621 CI_DRM_17620 IGT_8649 CI_DRM_17619 IGT_8648 CI_DRM_17618 CI_DRM_17617 CI_DRM_17616 CI_DRM_17615 IGT_8647 CI_DRM_17614 CI_DRM_17613 IGT_8646 CI_DRM_17612 CI_DRM_17611 CI_DRM_17610 CI_DRM_17609 CI_DRM_17608 CI_DRM_17607 IGT_8645 IGT_8644 IGT_8643
shard-mtlp
 
 
 
 
 
 
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8654

Using IGT_SRANDOM=1764936636 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.173s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.175s)
 
 
 
 
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8651

Using IGT_SRANDOM=1764914120 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.179s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.181s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8650

Using IGT_SRANDOM=1764912127 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.160s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.161s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17621

Using IGT_SRANDOM=1764884855 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.108s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.110s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17620

Using IGT_SRANDOM=1764878421 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.154s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.155s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8649

Using IGT_SRANDOM=1764865675 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.176s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.177s)
 
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17618

Using IGT_SRANDOM=1764845400 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.169s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.170s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17617

Using IGT_SRANDOM=1764624408 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.117s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.118s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17616

Using IGT_SRANDOM=1764618009 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.121s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.122s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17615

Using IGT_SRANDOM=1764614930 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.155s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.158s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8647

Using IGT_SRANDOM=1764612418 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.183s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.185s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17614

Using IGT_SRANDOM=1764611783 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.112s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.114s)
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8646

Using IGT_SRANDOM=1764593059 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.162s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.163s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17612

Using IGT_SRANDOM=1764588126 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.126s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.128s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17611

Using IGT_SRANDOM=1764585814 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.117s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.118s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17610

Using IGT_SRANDOM=1764583590 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.130s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.131s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17609

Using IGT_SRANDOM=1764558274 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.187s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.188s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17608

Using IGT_SRANDOM=1764372335 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.118s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.119s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17607

Using IGT_SRANDOM=1764353187 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.121s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.122s)
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8645

Using IGT_SRANDOM=1764336650 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.115s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.117s)
 
igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8643

Using IGT_SRANDOM=1764295523 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.120s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.121s)
Created at 2025-12-05 13:09:02