igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode CI History

Using IGT_SRANDOM=1776370351 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.200s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.202s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18342

Using IGT_SRANDOM=1776368123 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.165s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.167s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18341

Using IGT_SRANDOM=1776361813 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.114s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.116s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18340

Using IGT_SRANDOM=1776353542 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.199s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.202s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18339

Using IGT_SRANDOM=1776350338 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.151s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.154s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18338

Using IGT_SRANDOM=1776337551 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.204s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.206s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18337

Using IGT_SRANDOM=1776319452 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.203s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.205s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18336

Using IGT_SRANDOM=1776316206 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.184s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.185s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18335

Using IGT_SRANDOM=1776299879 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.145s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.147s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8860

Using IGT_SRANDOM=1776283837 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.175s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.177s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18334

Using IGT_SRANDOM=1776273642 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.163s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.164s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18333

Using IGT_SRANDOM=1776257531 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.114s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.116s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18332

Using IGT_SRANDOM=1776245497 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.135s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.137s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8859

Using IGT_SRANDOM=1776239758 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.193s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.195s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8858

Using IGT_SRANDOM=1776220863 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.151s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.153s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8857

Using IGT_SRANDOM=1776218514 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.125s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.126s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18331

Using IGT_SRANDOM=1776213364 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.124s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.125s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8856

Using IGT_SRANDOM=1776210100 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.138s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.140s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18330

Using IGT_SRANDOM=1776196947 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.126s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.127s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18329

Using IGT_SRANDOM=1776183812 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.128s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.129s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18328

Using IGT_SRANDOM=1776174007 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.141s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.142s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18327

Using IGT_SRANDOM=1776164896 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.139s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.140s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
IGT_8855

Using IGT_SRANDOM=1776155285 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.140s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.141s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18326

Using IGT_SRANDOM=1776127214 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.168s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.169s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18325

Using IGT_SRANDOM=1776120935 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.149s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.150s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18324

Using IGT_SRANDOM=1776108899 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.157s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.158s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18323

Using IGT_SRANDOM=1776105994 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.134s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.136s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18322

Using IGT_SRANDOM=1776099633 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.138s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.139s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18321

Using IGT_SRANDOM=1776093952 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.146s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.147s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18320

Using IGT_SRANDOM=1776088473 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.138s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.139s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18319

Using IGT_SRANDOM=1776071344 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.161s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.164s)

igt@kms_flip_scaled_crc@flip-64bpp-linear-to-32bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_18318

Using IGT_SRANDOM=1776068152 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-32bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.127s)
No dynamic tests executed.
Subtest flip-64bpp-linear-to-32bpp-linear-downscaling: SKIP (1.129s)