Using IGT_SRANDOM=1779313462 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779302956 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779298171 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779294060 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779285642 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779274332 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779266085 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779261809 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779253685 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779249722 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779237996 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779225070 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779209838 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779201530 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779196916 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779184212 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779179989 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779175644 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779159711 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779155275 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779151046 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779142625 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779130042 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779121845 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779314020 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779302634 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779298423 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779294263 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779285892 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779274661 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779266439 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779262007 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779254013 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779249966 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779238224 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779225276 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779202134 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779184912 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779180718 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779176091 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779160247 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779155936 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779151814 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779143386 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779130443 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779122281 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779301872 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779297747 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779293539 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779285043 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779273800 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779265620 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779261340 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779253079 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779249169 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779237802 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779224617 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779200835 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779183598 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779179471 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779159145 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779154790 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779150262 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779130166 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779120987 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779313549 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779302506 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779298366 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779294295 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779285725 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779274437 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779266126 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779261936 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779253780 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779249766 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779238146 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779225039 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779210134 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779201842 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779197531 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779184474 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779180551 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779176130 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779160141 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779155383 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779151641 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779142780 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779130567 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779122021 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779312718 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779301655 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779297435 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779293336 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779284632 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779273330 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779265089 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779260780 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779252670 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779248677 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779236968 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779224577 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779208887 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779200525 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779196224 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779183333 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779179130 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779174617 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779158643 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779154361 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779150100 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779141728 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779129199 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779120567 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: igt_display_has_format_mod(&data.display, flip_scenario_test...
Last errno: 95, Operation not supported
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779313495 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.880s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.885s)

Using IGT_SRANDOM=1779302319 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.888s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.894s)

Using IGT_SRANDOM=1779294350 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.913s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.919s)

Using IGT_SRANDOM=1779286064 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.993s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (1.001s)

Using IGT_SRANDOM=1779274714 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.886s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.891s)

Using IGT_SRANDOM=1779266359 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.963s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.970s)

Using IGT_SRANDOM=1779262212 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.941s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.949s)

Using IGT_SRANDOM=1779253915 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.814s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.819s)

Using IGT_SRANDOM=1779249906 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.886s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.891s)

Using IGT_SRANDOM=1779238444 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.854s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.859s)

Using IGT_SRANDOM=1779224969 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.851s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.856s)

Using IGT_SRANDOM=1779210602 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.869s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.874s)

Using IGT_SRANDOM=1779202091 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytileccs-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-valid-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !(ret == -ERANGE)
Platform scaling limits exceeded, skipping.
Last errno: 34, Numerical result out of range
Dynamic subtest pipe-A-valid-mode: SKIP (0.855s)
No dynamic tests executed.
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.862s)

Using IGT_SRANDOM=1779315218 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779304286 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779300090 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779295962 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779287020 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779275557 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779267277 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779263267 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779254934 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779250909 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779239375 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779226171 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779211426 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779203314 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779199109 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779186013 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779181758 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779177440 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779161409 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779157299 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779153012 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779144520 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779131902 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)

Using IGT_SRANDOM=1779123299 for randomisation
Opened device: /dev/dri/card0
Test requirement not met in function __igt_unique____real_main872, file ../tes...
Test requirement: data.gen >= 9
Subtest flip-32bpp-ytileccs-to-64bpp-ytile-downscaling: SKIP (0.000s)