FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17821 CI_DRM_17820 IGT_8701 CI_DRM_17819 IGT_8700 CI_DRM_17818 CI_DRM_17817 CI_DRM_17816 CI_DRM_17815 CI_DRM_17814 CI_DRM_17813 CI_DRM_17812 CI_DRM_17811 IGT_8699 IGT_8698 CI_DRM_17810 CI_DRM_17809 IGT_8697 CI_DRM_17808 CI_DRM_17807 CI_DRM_17806 CI_DRM_17805 CI_DRM_17804 CI_DRM_17803 IGT_8696 CI_DRM_17802 IGT_8695 CI_DRM_17801 CI_DRM_17800 CI_DRM_17799 CI_DRM_17798 IGT_8694 IGT_8693
shard-mtlp
 
 
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8701

Using IGT_SRANDOM=1768407386 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17819

Using IGT_SRANDOM=1768405749 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8700

Using IGT_SRANDOM=1768395804 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17818

Using IGT_SRANDOM=1768391327 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.297s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.299s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17817

Using IGT_SRANDOM=1768366971 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17816

Using IGT_SRANDOM=1768362792 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17815

Using IGT_SRANDOM=1768358623 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.293s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.294s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17814

Using IGT_SRANDOM=1768323132 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.287s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17813

Using IGT_SRANDOM=1768309454 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17812

Using IGT_SRANDOM=1768306117 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17811

Using IGT_SRANDOM=1768291128 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8699

Using IGT_SRANDOM=1768277532 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.291s)
 
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17810

Using IGT_SRANDOM=1768260395 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.296s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.298s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17809

Using IGT_SRANDOM=1768257103 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.283s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.285s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8697

Using IGT_SRANDOM=1768250416 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.295s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.297s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17808

Using IGT_SRANDOM=1768248290 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.305s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.308s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17807

Using IGT_SRANDOM=1768244981 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.285s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.287s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17806

Using IGT_SRANDOM=1768241692 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.294s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.296s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17805

Using IGT_SRANDOM=1768235104 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17804

Using IGT_SRANDOM=1768231835 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.285s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17803

Using IGT_SRANDOM=1768225411 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.293s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.295s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8696

Using IGT_SRANDOM=1768202620 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.290s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17802

Using IGT_SRANDOM=1768196516 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.282s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.284s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8695

Using IGT_SRANDOM=1768188864 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.292s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17801

Using IGT_SRANDOM=1768145328 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.291s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17800

Using IGT_SRANDOM=1768088720 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.308s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.310s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17799

Using IGT_SRANDOM=1768070749 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
CI_DRM_17798

Using IGT_SRANDOM=1768007602 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.287s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8694

Using IGT_SRANDOM=1767997596 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.303s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.306s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-64bpp-ytile-downscaling@pipe-a-default-mode
IGT_8693

Using IGT_SRANDOM=1767948709 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-64bpp-ytile-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-64bpp-ytile-downscaling: SKIP (0.293s)
Created at 2026-01-14 18:08:52