FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17639 CI_DRM_17637 CI_DRM_17636 CI_DRM_17635 CI_DRM_17634 IGT_8655 CI_DRM_17633 IGT_8654 IGT_8653 CI_DRM_17632 CI_DRM_17631 CI_DRM_17630 IGT_8652 IGT_8651 IGT_8650 CI_DRM_17621 CI_DRM_17620 IGT_8649 CI_DRM_17619 IGT_8648 CI_DRM_17618 CI_DRM_17617 CI_DRM_17616 CI_DRM_17615 IGT_8647 CI_DRM_17614 CI_DRM_17613 IGT_8646 CI_DRM_17612 CI_DRM_17611 CI_DRM_17610 CI_DRM_17609 CI_DRM_17608 CI_DRM_17607 IGT_8645 IGT_8644 IGT_8643
shard-mtlp
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8654
Using IGT_SRANDOM=1764936679 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.292s)
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17632
Using IGT_SRANDOM=1764930540 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.301s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.302s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17631
Using IGT_SRANDOM=1764927208 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.291s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17630
Using IGT_SRANDOM=1764924757 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.304s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.306s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8652
Using IGT_SRANDOM=1764921438 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.291s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8651
Using IGT_SRANDOM=1764915453 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.290s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8650
Using IGT_SRANDOM=1764911147 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.291s)
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8649
Using IGT_SRANDOM=1764866598 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.287s)
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17618
Using IGT_SRANDOM=1764847261 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.303s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.305s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17617
Using IGT_SRANDOM=1764626304 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.288s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17616
Using IGT_SRANDOM=1764619858 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.288s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17615
Using IGT_SRANDOM=1764616694 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.287s)
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8647
Using IGT_SRANDOM=1764614243 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
 
 
 
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8644
Using IGT_SRANDOM=1764304931 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.292s)
 
Created at 2025-12-05 13:08:52