FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17738 CI_DRM_17737 CI_DRM_17736 CI_DRM_17735 CI_DRM_17734 IGT_8677 CI_DRM_17733 CI_DRM_17732 CI_DRM_17731 CI_DRM_17730 CI_DRM_17729 CI_DRM_17728 CI_DRM_17727 CI_DRM_17726 CI_DRM_17725 CI_DRM_17724 CI_DRM_17723 CI_DRM_17722 CI_DRM_17721 CI_DRM_17720 CI_DRM_17719 CI_DRM_17718 CI_DRM_17717 IGT_8674 IGT_8673 IGT_8672
shard-mtlp
 
 
 
 
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17734

Using IGT_SRANDOM=1766601466 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8677

Using IGT_SRANDOM=1766597934 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17733

Using IGT_SRANDOM=1766583095 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17732

Using IGT_SRANDOM=1766535850 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.301s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.302s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17731

Using IGT_SRANDOM=1766528848 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17730

Using IGT_SRANDOM=1766522543 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17729

Using IGT_SRANDOM=1766519524 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.285s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17728

Using IGT_SRANDOM=1766496651 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.290s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.292s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17727

Using IGT_SRANDOM=1766487432 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.292s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17726

Using IGT_SRANDOM=1766484220 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.298s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.300s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17725

Using IGT_SRANDOM=1766480902 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.288s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17724

Using IGT_SRANDOM=1766477601 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17723

Using IGT_SRANDOM=1766474332 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.286s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.287s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17722

Using IGT_SRANDOM=1766467583 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.298s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.300s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17721

Using IGT_SRANDOM=1766461125 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.297s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.298s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17720

Using IGT_SRANDOM=1766454406 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.291s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.293s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17719

Using IGT_SRANDOM=1766451078 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.289s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.291s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17718

Using IGT_SRANDOM=1766441734 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
CI_DRM_17717

Using IGT_SRANDOM=1766438350 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.284s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.286s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8674

Using IGT_SRANDOM=1766098301 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.301s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.302s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8673

Using IGT_SRANDOM=1766078203 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.288s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.289s)
igt@kms_flip_scaled_crc@flip-32bpp-ytile-to-32bpp-ytileccs-downscaling@pipe-a-default-mode
IGT_8672

Using IGT_SRANDOM=1766068420 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-ytile-to-32bpp-ytileccs-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function setup_fb, file ../tests/intel/kms_flip_sc...
Test requirement: igt_display_has_format_mod(&data->display, format, modifier)
Dynamic subtest pipe-A-default-mode: SKIP (0.287s)
No dynamic tests executed.
Subtest flip-32bpp-ytile-to-32bpp-ytileccs-downscaling: SKIP (0.289s)
Created at 2025-12-24 19:44:55