FAIL WARN PASS SKIP TIMEOUT NOT RUN INCOMPLETE ABORT CRASH
 
CI_DRM_17639 CI_DRM_17637 CI_DRM_17636 CI_DRM_17635 CI_DRM_17634 IGT_8655 CI_DRM_17633 IGT_8654 IGT_8653 CI_DRM_17632 CI_DRM_17631 CI_DRM_17630 IGT_8652 IGT_8651 IGT_8650 CI_DRM_17621 CI_DRM_17620 IGT_8649 CI_DRM_17619 IGT_8648 CI_DRM_17618 CI_DRM_17617 CI_DRM_17616 CI_DRM_17615 IGT_8647 CI_DRM_17614 CI_DRM_17613 IGT_8646 CI_DRM_17612 CI_DRM_17611 CI_DRM_17610 CI_DRM_17609 CI_DRM_17608 CI_DRM_17607 IGT_8645 IGT_8644 IGT_8643
shard-mtlp
 
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
IGT_8653
Using IGT_SRANDOM=1764933518 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.157s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.158s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17632
Using IGT_SRANDOM=1764931245 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.180s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.181s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17631
Using IGT_SRANDOM=1764928046 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.123s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.125s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17630
Using IGT_SRANDOM=1764925486 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.112s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.113s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
IGT_8652
Using IGT_SRANDOM=1764922253 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.129s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.132s)
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
IGT_8650
Using IGT_SRANDOM=1764912649 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.178s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.179s)
 
 
 
 
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17615
Using IGT_SRANDOM=1764616646 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.134s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.136s)
 
 
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17612
Using IGT_SRANDOM=1764587359 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.139s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.141s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17611
Using IGT_SRANDOM=1764584900 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.143s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.144s)
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17610
Using IGT_SRANDOM=1764582455 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.151s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.153s)
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
CI_DRM_17607
Using IGT_SRANDOM=1764352418 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.142s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.144s)
 
 
  igt@kms_flip_scaled_crc@flip-32bpp-linear-to-64bpp-linear-downscaling@pipe-a-default-mode
IGT_8643
Using IGT_SRANDOM=1764295399 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-linear-to-64bpp-linear-downscaling
Starting dynamic subtest: pipe-A-default-mode
Test requirement not met in function test_flip_to_scaled, file ../tests/intel/...
Test requirement: !((ret == -EINVAL) && (!modetoset || modetoset->vrefresh > 9...
Valid/default mode too big, cdclk limits exceeded. Check next connector
Last errno: 22, Invalid argument
Dynamic subtest pipe-A-default-mode: SKIP (1.149s)
No dynamic tests executed.
Subtest flip-32bpp-linear-to-64bpp-linear-downscaling: SKIP (1.150s)
Created at 2025-12-05 13:08:52